A New Reliability Evaluation Methodology With Application to Lifetime Oriented Circuit Design
نویسندگان
چکیده
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ژورنال
عنوان ژورنال: IEEE Transactions on Device and Materials Reliability
سال: 2013
ISSN: 1530-4388,1558-2574
DOI: 10.1109/tdmr.2012.2228862